As shown in
Figure 5B, for masks with a 15 ms delay of the p1 or p3 lines, there was a significant effect of the offset direction of the mask elements on vernier dominance, 25V, 25N, or 25AV,
F(2, 8) = 6.33,
p < 0.05, and a significant effect of the position of the delayed line relative to the target, p1, p3, or standard,
F(2, 8) = 10.34,
p < 0.01. This effect increased with longer delays (
Figures 5C and
D). For masks with a 45 ms delay ANOVA shows the following factors as significant: offset of mask elements, 25V, 25N, or 25AV,
F(2, 8) = 7.21,
p < 0.05; position of delayed line, p1, p3, or standard,
F(2, 8) = 85.71,
p < 0.001, and a marginally significant interaction,
F(4, 16) = 2.98,
p = 0.051) For masks with a 135 ms delay, 25V, 25N, or 25AV,
F(2, 8) = 12.27,
p < 0.01; p1, p3, or standard,
F(2, 8) = 51.19,
p < 0.001. There was significant interaction,
F(4, 16) = 4.20,
p < 0.05.